TSF010 Power Consumption: Difference between revisions
No edit summary |
No edit summary |
||
Line 191: | Line 191: | ||
<td><center><b>22</b></center></td> | <td><center><b>22</b></center></td> | ||
<td><center><b>1.25</b></center></td> | <td><center><b>1.25</b></center></td> | ||
</tr> | </tr> | ||
</table> | </table> |
Revision as of 08:30, 14 May 2024
Main Page > TSF Switches > TSF010 > TSF010 Manual > TSF010 Power ConsumptionTSF010 power consumption values in different states of operation are represented in the table(s) below:
Test type | ||
---|---|---|
Idle (9 V) | ||
Idle (12 V) | ||
Idle (24 V) | ||
Idle (44 V) | ||
Idle (50 V) | ||
Idle (57 V) |
Test type | ||
---|---|---|
Idle, 2 LAN device connected (9 V) | ||
Idle, 2 LAN device connected (12 V) | ||
Idle, 2 LAN device connected (24 V) | ||
Idle, 2 LAN device connected (44 V) | ||
Idle, 2 LAN device connected (50 V) | ||
Idle, 2 LAN device connected (57 V) |
Test type | ||
---|---|---|
2 LAN devices connected + heavy data traffic1 (9 V) | ||
2 LAN devices connected + heavy data traffic1 (12 V) | ||
2 LAN devices connected + heavy data traffic1 (24 V) | ||
2 LAN devices connected + heavy data traffic1 (44 V) | ||
2 LAN devices connected + heavy data traffic1 (50 V) | ||
2 LAN devices connected + heavy data traffic1 (57 V) |
Test type | ||
---|---|---|
Idle, 5 LAN device connected (9 V) | ||
Idle, 5 LAN device connected (12 V) | ||
Idle, 5 LAN device connected (24 V) | ||
Idle, 5 LAN device connected (44 V) | ||
Idle, 5 LAN device connected (50 V) | ||
Idle, 5 LAN device connected (57 V) |
Test type | ||
---|---|---|
5 LAN devices connected + heavy data traffic1 (9 V) | ||
5 LAN devices connected + heavy data traffic1 (12 V) | ||
5 LAN devices connected + heavy data traffic1 (24 V) | ||
5 LAN devices connected + heavy data traffic1 (44 V) | ||
5 LAN devices connected + heavy data traffic1 (50 V) | ||
5 LAN devices connected + heavy data traffic1 (57 V) |
1 - Data streams between devices were created using iPerf.
Power consumption may differ due to connected devices, testing environment and conditions.